Reliability growth modeling for in-service electronic systems considering latent failure modes

Tongdan Jin, Haitao Liao, Madhu Kilari. Reliability growth modeling for in-service electronic systems considering latent failure modes. Microelectronics Reliability, 50(3):324-331, 2010. [doi]

Authors

Tongdan Jin

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Haitao Liao

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Madhu Kilari

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