Hao Jin, Xiao Xu, Yebo Tao, Bin Feng, Demiao Wang. Reliability enhancement of zinc oxide varistors using sputtered silver electrodes. Microelectronics Reliability, 61:91-94, 2016. [doi]
@article{JinXTFW16,
title = {Reliability enhancement of zinc oxide varistors using sputtered silver electrodes},
author = {Hao Jin and Xiao Xu and Yebo Tao and Bin Feng and Demiao Wang},
year = {2016},
doi = {10.1016/j.microrel.2016.02.005},
url = {http://dx.doi.org/10.1016/j.microrel.2016.02.005},
researchr = {https://researchr.org/publication/JinXTFW16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {61},
pages = {91-94},
}