Yi Jin 0004, Qingyuan Zhang, Yunxia Chen, Zhendan Lu, Tianpei Zu. Cascading failures modeling of electronic circuits with degradation using impedance network. Rel. Eng. & Sys. Safety, 233:109101, May 2023. [doi]
@article{JinZCLZ23,
title = {Cascading failures modeling of electronic circuits with degradation using impedance network},
author = {Yi Jin 0004 and Qingyuan Zhang and Yunxia Chen and Zhendan Lu and Tianpei Zu},
year = {2023},
month = {May},
doi = {10.1016/j.ress.2023.109101},
url = {https://doi.org/10.1016/j.ress.2023.109101},
researchr = {https://researchr.org/publication/JinZCLZ23},
cites = {0},
citedby = {0},
journal = {Rel. Eng. & Sys. Safety},
volume = {233},
pages = {109101},
}