Quantification of Complex Defects in Magnetic Flux Leakage (MFL) Testing Using Gradient Gray Level Analysis Based on Least Square Approximation

Alimey Fred John, Haichao Yu, Libing Bai, Yuhua Cheng, Yonggang Wang, Jinhua Mi. Quantification of Complex Defects in Magnetic Flux Leakage (MFL) Testing Using Gradient Gray Level Analysis Based on Least Square Approximation. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019. pages 1-6, IEEE, 2019. [doi]

@inproceedings{JohnYBCWM19,
  title = {Quantification of Complex Defects in Magnetic Flux Leakage (MFL) Testing Using Gradient Gray Level Analysis Based on Least Square Approximation},
  author = {Alimey Fred John and Haichao Yu and Libing Bai and Yuhua Cheng and Yonggang Wang and Jinhua Mi},
  year = {2019},
  doi = {10.1109/I2MTC.2019.8827077},
  url = {https://doi.org/10.1109/I2MTC.2019.8827077},
  researchr = {https://researchr.org/publication/JohnYBCWM19},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019},
  publisher = {IEEE},
  isbn = {978-1-5386-3460-8},
}