Micah K. Johnson, Edward H. Adelson. Retrographic sensing for the measurement of surface texture and shape. In 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2009), 20-25 June 2009, Miami, Florida, USA. pages 1070-1077, IEEE, 2009. [doi]
@inproceedings{JohnsonA09,
title = {Retrographic sensing for the measurement of surface texture and shape},
author = {Micah K. Johnson and Edward H. Adelson},
year = {2009},
doi = {10.1109/CVPRW.2009.5206534},
url = {http://doi.ieeecomputersociety.org/10.1109/CVPRW.2009.5206534},
researchr = {https://researchr.org/publication/JohnsonA09},
cites = {0},
citedby = {0},
pages = {1070-1077},
booktitle = {2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2009), 20-25 June 2009, Miami, Florida, USA},
publisher = {IEEE},
isbn = {978-1-4244-3992-8},
}