Jeff Jones, Joe Hayes. Investigation of the occurrence of: no-faults-found in electronic equipment. IEEE Transactions on Reliability, 50(3):289-292, 2001. [doi]
@article{JonesH01a,
title = {Investigation of the occurrence of: no-faults-found in electronic equipment},
author = {Jeff Jones and Joe Hayes},
year = {2001},
doi = {10.1109/24.974126},
url = {http://dx.doi.org/10.1109/24.974126},
researchr = {https://researchr.org/publication/JonesH01a},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {50},
number = {3},
pages = {289-292},
}