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Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology

Adam Jones, Leshan Uggalla, Kang Li, Yuanlong Fan, Ashley Willow, Christopher A. Mills, Nigel Copner. Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential Technology. Sensors, 21(10):3340, 2021. [doi]

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