Bongjin Jun, Taewan Kim, Daijin Kim. A compact local binary pattern using maximization of mutual information for face analysis. Pattern Recognition, 44(3):532-543, 2011. [doi]
@article{JunKK11,
title = {A compact local binary pattern using maximization of mutual information for face analysis},
author = {Bongjin Jun and Taewan Kim and Daijin Kim},
year = {2011},
doi = {10.1016/j.patcog.2010.10.008},
url = {http://dx.doi.org/10.1016/j.patcog.2010.10.008},
tags = {analysis},
researchr = {https://researchr.org/publication/JunKK11},
cites = {0},
citedby = {0},
journal = {Pattern Recognition},
volume = {44},
number = {3},
pages = {532-543},
}