Yuan Jun, Tachibana Masayoshi. A BIST scheme for operational amplifier by checking the stable output of transient response. In 20th European Conference on Circuit Theory and Design, ECCTD 2011, Linkoping, Sweden, Aug. 29-31, 2011. pages 885-888, IEEE, 2011. [doi]
@inproceedings{JunM11,
title = {A BIST scheme for operational amplifier by checking the stable output of transient response},
author = {Yuan Jun and Tachibana Masayoshi},
year = {2011},
doi = {10.1109/ECCTD.2011.6043816},
url = {http://dx.doi.org/10.1109/ECCTD.2011.6043816},
researchr = {https://researchr.org/publication/JunM11},
cites = {0},
citedby = {0},
pages = {885-888},
booktitle = {20th European Conference on Circuit Theory and Design, ECCTD 2011, Linkoping, Sweden, Aug. 29-31, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0617-2},
}