Functional Testbench Qualification by Mutation Analysis - researchr publication bibtex

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Huang Kai, Peng Zhu, Rongjie Yan, Xiaolang Yan. Functional Testbench Qualification by Mutation Analysis. VLSI Design, 2015, 2015. [doi]

@article{KaiZYY15,
  title = {Functional Testbench Qualification by Mutation Analysis},
  author = {Huang Kai and Peng Zhu and Rongjie Yan and Xiaolang Yan},
  year = {2015},
  doi = {10.1155/2015/256474},
  url = {http://dx.doi.org/10.1155/2015/256474},
  researchr = {https://researchr.org/publication/KaiZYY15},
  cites = {0},
  citedby = {0},
  journal = {VLSI Design},
  volume = {2015},
}

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