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Observation of Anomalous Negative Differential Resistance in Diode Breakdown Simulation Using Carrier Temperature Dependent Impact Ionization

Edwin C. Kan, Gyoyoung Jin, Zhiping Yu, Robert W. Dutton. Observation of Anomalous Negative Differential Resistance in Diode Breakdown Simulation Using Carrier Temperature Dependent Impact Ionization. VLSI Design, 1998(1):299-302, 1998. [doi]

Authors

Edwin C. Kan

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Gyoyoung Jin

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Zhiping Yu

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Robert W. Dutton

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