Mineo Kaneko. Margin aware timing test and tuning algorithm for post-silicon skew tuning. In IEEE 60th International Midwest Symposium on Circuits and Systems, MWSCAS 2017, Boston, MA, USA, August 6-9, 2017. pages 1244-1247, IEEE, 2017. [doi]
@inproceedings{Kaneko17-4,
title = {Margin aware timing test and tuning algorithm for post-silicon skew tuning},
author = {Mineo Kaneko},
year = {2017},
doi = {10.1109/MWSCAS.2017.8053155},
url = {https://doi.org/10.1109/MWSCAS.2017.8053155},
researchr = {https://researchr.org/publication/Kaneko17-4},
cites = {0},
citedby = {0},
pages = {1244-1247},
booktitle = {IEEE 60th International Midwest Symposium on Circuits and Systems, MWSCAS 2017, Boston, MA, USA, August 6-9, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6389-5},
}