Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration

Sangwoo Kang 0001, Mikyoung Lim, Won-Kwang Park. Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration. J. Comput. Physics, 468:111479, 2022. [doi]

Authors

Sangwoo Kang 0001

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Mikyoung Lim

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Won-Kwang Park

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