One-step majority-logic-decodable codes enable STT-MRAM for high speed working memories

Wang Kang, Weisheng Zhao, Lun Yang, Jacques-Olivier Klein, Youguang Zhang, Dafine Ravelosona. One-step majority-logic-decodable codes enable STT-MRAM for high speed working memories. In IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2014, Chongqing, China, August 20-21, 2014. pages 1-6, IEEE, 2014. [doi]

@inproceedings{KangZYKZR14,
  title = {One-step majority-logic-decodable codes enable STT-MRAM for high speed working memories},
  author = {Wang Kang and Weisheng Zhao and Lun Yang and Jacques-Olivier Klein and Youguang Zhang and Dafine Ravelosona},
  year = {2014},
  doi = {10.1109/NVMSA.2014.6927189},
  url = {http://dx.doi.org/10.1109/NVMSA.2014.6927189},
  researchr = {https://researchr.org/publication/KangZYKZR14},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2014, Chongqing, China, August 20-21, 2014},
  publisher = {IEEE},
}