Tzu-Cheng Kao, Chen-Hsin Lien, Chien-Wei Chiu, Jian-Hsing Lee, Yen-Hsiang Lo, Chung-Yu Hung, Tsung-Yi Huang, Hung-Der Su. Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 5, IEEE, 2015. [doi]
@inproceedings{KaoLCLLHHS15,
title = {Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering},
author = {Tzu-Cheng Kao and Chen-Hsin Lien and Chien-Wei Chiu and Jian-Hsing Lee and Yen-Hsiang Lo and Chung-Yu Hung and Tsung-Yi Huang and Hung-Der Su},
year = {2015},
doi = {10.1109/IRPS.2015.7112796},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112796},
researchr = {https://researchr.org/publication/KaoLCLLHHS15},
cites = {0},
citedby = {0},
pages = {5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}