Scott L. Kaplin, George D. Hadden, Lina Volovik, Rick Swanson. A General Architecture for Factory-based Diagnosis of Electronics. In IEA/AIE (Vol. 1). pages 100-108, 1988. [doi]
@inproceedings{KaplinHVS88,
title = {A General Architecture for Factory-based Diagnosis of Electronics},
author = {Scott L. Kaplin and George D. Hadden and Lina Volovik and Rick Swanson},
year = {1988},
doi = {10.1145/51909.51923},
url = {http://doi.acm.org/10.1145/51909.51923},
tags = {rule-based, architecture},
researchr = {https://researchr.org/publication/KaplinHVS88},
cites = {0},
citedby = {0},
pages = {100-108},
booktitle = {IEA/AIE (Vol. 1)},
}