Vivart Kapoor, Daniel Haller. Cloud-based standardized device diagnostics for optimized operability of plants in the process industry: Cloud based self-monitoring and diagnosis of the field devices. In Paul Davidsson, Marc Langheinrich, Per Linde, Simon Mayer, Diego Casado Mansilla, Daniel Spikol, Frank Alexander Kraemer, Nancy L. Russo, editors, IoT '20 Companion: 10th International Conference on the Internet of Things Companion, Malmö Sweden, October 6-9, 2020. ACM, 2020. [doi]
@inproceedings{KapoorH20,
title = {Cloud-based standardized device diagnostics for optimized operability of plants in the process industry: Cloud based self-monitoring and diagnosis of the field devices},
author = {Vivart Kapoor and Daniel Haller},
year = {2020},
doi = {10.1145/3423423.3423466},
url = {https://doi.org/10.1145/3423423.3423466},
researchr = {https://researchr.org/publication/KapoorH20},
cites = {0},
citedby = {0},
booktitle = {IoT '20 Companion: 10th International Conference on the Internet of Things Companion, Malmö Sweden, October 6-9, 2020},
editor = {Paul Davidsson and Marc Langheinrich and Per Linde and Simon Mayer and Diego Casado Mansilla and Daniel Spikol and Frank Alexander Kraemer and Nancy L. Russo},
publisher = {ACM},
isbn = {978-1-4503-8820-7},
}