Ron Kapusta, Haiyang Zhu, Colin Lyden. Sampling circuits that break the kT/C thermal noise limit. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-6, IEEE, 2013. [doi]
@inproceedings{KapustaZL13,
title = {Sampling circuits that break the kT/C thermal noise limit},
author = {Ron Kapusta and Haiyang Zhu and Colin Lyden},
year = {2013},
doi = {10.1109/CICC.2013.6658440},
url = {http://dx.doi.org/10.1109/CICC.2013.6658440},
researchr = {https://researchr.org/publication/KapustaZL13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013},
publisher = {IEEE},
}