Reducing Test Cost and Improving Documentation In TDD (Test Driven Development)

Taha Karamat, Atif Neuman Jamil. Reducing Test Cost and Improving Documentation In TDD (Test Driven Development). In Yeong-Tae Song, Chao Lu, Roger Lee, editors, Seventh International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD 2006), 19-20 June 2006, Las Vegas, Nevada, USA. pages 73-76, IEEE Computer Society, 2006. [doi]

@inproceedings{KaramatJ06,
  title = {Reducing Test Cost and Improving Documentation In TDD (Test Driven Development)},
  author = {Taha Karamat and Atif Neuman Jamil},
  year = {2006},
  doi = {10.1109/SNPD-SAWN.2006.59},
  url = {http://doi.ieeecomputersociety.org/10.1109/SNPD-SAWN.2006.59},
  tags = {meta-model, testing, model-driven development, Meta-Environment},
  researchr = {https://researchr.org/publication/KaramatJ06},
  cites = {0},
  citedby = {0},
  pages = {73-76},
  booktitle = {Seventh International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD 2006), 19-20 June 2006, Las Vegas, Nevada, USA},
  editor = {Yeong-Tae Song and Chao Lu and Roger Lee},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2611-X},
}