Naghmeh Karimi, Thorben Moos, Amir Moradi 0001. Exploring the Effect of Device Aging on Static Power Analysis Attacks. IACR Trans. Cryptogr. Hardw. Embed. Syst., 2019(3):233-256, 2019. [doi]
@article{KarimiMM19,
title = {Exploring the Effect of Device Aging on Static Power Analysis Attacks},
author = {Naghmeh Karimi and Thorben Moos and Amir Moradi 0001},
year = {2019},
doi = {10.13154/tches.v2019.i3.233-256},
url = {https://doi.org/10.13154/tches.v2019.i3.233-256},
researchr = {https://researchr.org/publication/KarimiMM19},
cites = {0},
citedby = {0},
journal = {IACR Trans. Cryptogr. Hardw. Embed. Syst.},
volume = {2019},
number = {3},
pages = {233-256},
}