Fernanda Lima Kastensmidt, Jorge Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost. Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs. Microelectronics Reliability, 54(9-10):2344-2348, 2014. [doi]
@article{KastensmidtTBRW14,
title = {Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs},
author = {Fernanda Lima Kastensmidt and Jorge Tonfat and Thiago Hanna Both and Paolo Rech and Gilson I. Wirth and Ricardo Reis and Florent Bruguier and Pascal Benoit and Lionel Torres and Christopher Frost},
year = {2014},
doi = {10.1016/j.microrel.2014.07.100},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.100},
researchr = {https://researchr.org/publication/KastensmidtTBRW14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {2344-2348},
}