Yasuhiro X. Kato, Tomoko Yonemura, Kazuyuki Samejima, Taro Maeda, Hideyuki Ando. Development of a BCI master switch based on single-trial detection of contingent negative variation related potentials. In 33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2011, Boston, MA, USA, August 30 - Sept. 3, 2011. pages 4629-4632, IEEE, 2011. [doi]
@inproceedings{KatoYSMA11,
title = {Development of a BCI master switch based on single-trial detection of contingent negative variation related potentials},
author = {Yasuhiro X. Kato and Tomoko Yonemura and Kazuyuki Samejima and Taro Maeda and Hideyuki Ando},
year = {2011},
doi = {10.1109/IEMBS.2011.6091146},
url = {https://doi.org/10.1109/IEMBS.2011.6091146},
researchr = {https://researchr.org/publication/KatoYSMA11},
cites = {0},
citedby = {0},
pages = {4629-4632},
booktitle = {33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2011, Boston, MA, USA, August 30 - Sept. 3, 2011},
publisher = {IEEE},
isbn = {978-1-4244-4121-1},
}