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Implications of test-driven development: a pilot study

Reid Kaufmann, David Janzen. Implications of test-driven development: a pilot study. In Ron Crocker, Guy L. Steele Jr., editors, Companion of the 18th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2003, October 26-30, 2003, Anaheim, CA, USA. pages 298-299, ACM, 2003. [doi]

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Reid Kaufmann

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David Janzen

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