Long, Short, Monolithic - The Gate Loop Challenge for GaN Drivers: Invited Paper - researchr publication authors

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Maik Kaufmann, Achim Seidel, Bernhard Wicht. Long, Short, Monolithic - The Gate Loop Challenge for GaN Drivers: Invited Paper. In 2020 IEEE Custom Integrated Circuits Conference, CICC 2020, Boston, MA, USA, March 22-25, 2020. pages 1-5, IEEE, 2020. [doi]

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