Baljit Kaur, Naushad Alam, S. K. Manhas, Bulusu Anand. Efficient ECSM Characterization Considering Voltage, Temperature, and Mechanical Stress Variability. IEEE Trans. on Circuits and Systems, 61-I(12):3407-3415, 2014. [doi]
@article{KaurAMA14,
title = {Efficient ECSM Characterization Considering Voltage, Temperature, and Mechanical Stress Variability},
author = {Baljit Kaur and Naushad Alam and S. K. Manhas and Bulusu Anand},
year = {2014},
doi = {10.1109/TCSI.2014.2336511},
url = {http://dx.doi.org/10.1109/TCSI.2014.2336511},
researchr = {https://researchr.org/publication/KaurAMA14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {61-I},
number = {12},
pages = {3407-3415},
}