Sukhvir Kaur, Shreelekha Pandey, Shivani Goel. Semi-automatic leaf disease detection and classification system for soybean culture. IET Image Processing, 12(6):1038-1048, 2018. [doi]
@article{KaurPG18,
title = {Semi-automatic leaf disease detection and classification system for soybean culture},
author = {Sukhvir Kaur and Shreelekha Pandey and Shivani Goel},
year = {2018},
doi = {10.1049/iet-ipr.2017.0822},
url = {https://doi.org/10.1049/iet-ipr.2017.0822},
researchr = {https://researchr.org/publication/KaurPG18},
cites = {0},
citedby = {0},
journal = {IET Image Processing},
volume = {12},
number = {6},
pages = {1038-1048},
}