NHK STRL at TRECVID 2008: High-Level Feature Extraction and Surveillance Event Detection

Yoshihiko Kawai, Noboru Babaguchi, Masaki Takahashi, Masanori Sano, Mahito Fujii, Masahiro Shibata, Nobuyuki Yagi. NHK STRL at TRECVID 2008: High-Level Feature Extraction and Surveillance Event Detection. In Paul Over, George Awad, R. Travis Rose, Jonathan G. Fiscus, Wessel Kraaij, Alan F. Smeaton, editors, TRECVID 2008 workshop participants notebook papers, Gaithersburg, MD, USA, November 2008. National Institute of Standards and Technology (NIST), 2008. [doi]

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