Sample-Dependent Distance for 1: N Identification via Discriminative Feature Selection

Naoki Kawamura, Susumu Kubota. Sample-Dependent Distance for 1: N Identification via Discriminative Feature Selection. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 3365-3371, IEEE, 2020. [doi]

@inproceedings{KawamuraK20,
  title = {Sample-Dependent Distance for 1: N Identification via Discriminative Feature Selection},
  author = {Naoki Kawamura and Susumu Kubota},
  year = {2020},
  doi = {10.1109/ICPR48806.2021.9412012},
  url = {https://doi.org/10.1109/ICPR48806.2021.9412012},
  researchr = {https://researchr.org/publication/KawamuraK20},
  cites = {0},
  citedby = {0},
  pages = {3365-3371},
  booktitle = {25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021},
  publisher = {IEEE},
  isbn = {978-1-7281-8808-9},
}