Feature Location for Multi-Layer System Based on Formal Concept Analysis

Hiroshi Kazato, Shinpei Hayashi, Satoshi Okada, Shunsuke Miyata, Takashi Hoshino, Motoshi Saeki. Feature Location for Multi-Layer System Based on Formal Concept Analysis. In Tom Mens, Anthony Cleve, Rudolf Ferenc, editors, 16th European Conference on Software Maintenance and Reengineering, CSMR 2012, Szeged, Hungary, March 27-30, 2012. pages 429-434, IEEE, 2012. [doi]

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