Simon Kennedy, Mehmet Rasit Yuce, Jean-Michel Redoute. Susceptibility of flash ADCs to electromagnetic interference. Microelectronics Reliability, 81:218-225, 2018. [doi]
@article{KennedyYR18,
title = {Susceptibility of flash ADCs to electromagnetic interference},
author = {Simon Kennedy and Mehmet Rasit Yuce and Jean-Michel Redoute},
year = {2018},
doi = {10.1016/j.microrel.2017.12.040},
url = {https://doi.org/10.1016/j.microrel.2017.12.040},
researchr = {https://researchr.org/publication/KennedyYR18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {81},
pages = {218-225},
}