Bart Keppens, V. De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken. Significance of the failure criterion on transmission line pulse testing. Microelectronics Reliability, 42(6):901-907, 2002. [doi]
@article{KeppensHIVG02,
title = {Significance of the failure criterion on transmission line pulse testing},
author = {Bart Keppens and V. De Heyn and M. Natarajan Iyer and Vesselin K. Vassilev and Guido Groeseneken},
year = {2002},
doi = {10.1016/S0026-2714(02)00053-7},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00053-7},
tags = {testing},
researchr = {https://researchr.org/publication/KeppensHIVG02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {6},
pages = {901-907},
}