Ming-Dou Ker, Kun-Hsien Lin, Che-Hao Chuang. MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process. IEICE Transactions, 88-C(3):429-436, 2005. [doi]
@article{KerLC05,
title = {MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process},
author = {Ming-Dou Ker and Kun-Hsien Lin and Che-Hao Chuang},
year = {2005},
doi = {10.1093/ietele/e88-c.3.429},
url = {http://dx.doi.org/10.1093/ietele/e88-c.3.429},
researchr = {https://researchr.org/publication/KerLC05},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {88-C},
number = {3},
pages = {429-436},
}