Microcrystalline silicon gauges on flexible substrates for high deformations with high spatial resolution

Y. Kervran, S. Janfaoui, O. de Sagazan, Samuel Crand, N. Coulon, J. P. Gauthier, Taieb Mohammed-Brahim. Microcrystalline silicon gauges on flexible substrates for high deformations with high spatial resolution. In Seventh International Conference on Sensing Technology, ICST 2013, Wellington, New Zealand, December 3-5, 2013. pages 603-607, IEEE, 2013. [doi]

Authors

Y. Kervran

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S. Janfaoui

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O. de Sagazan

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Samuel Crand

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N. Coulon

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J. P. Gauthier

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Taieb Mohammed-Brahim

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