SAT-based reverse engineering of gate-level schematics using fault injection and probing - researchr publication authors

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Shahrzad Keshavarz, Falk Schellenberg, Bastian Richter, Christof Paar, Daniel Holcomb. SAT-based reverse engineering of gate-level schematics using fault injection and probing. In 2018 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2018, Washington, DC, USA, April 30 - May 4, 2018. pages 215-220, IEEE Computer Society, 2018. [doi]

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