Optimal Line and Arc Detection on Run-Length Representations

Daniel Keysers, Thomas M. Breuel. Optimal Line and Arc Detection on Run-Length Representations. In Wenyin Liu, Josep Lladós, editors, Graphics Recognition. Ten Years Review and Future Perspectives, 6th Internation Workshop, GREC 2005, Hong Kong, China, August 25-26, 2005, Revised Selected Papers. Volume 3926 of Lecture Notes in Computer Science, pages 369-380, Springer, 2005. [doi]

@inproceedings{KeysersB05,
  title = {Optimal Line and Arc Detection on Run-Length Representations},
  author = {Daniel Keysers and Thomas M. Breuel},
  year = {2005},
  doi = {10.1007/11767978_34},
  url = {http://dx.doi.org/10.1007/11767978_34},
  researchr = {https://researchr.org/publication/KeysersB05},
  cites = {0},
  citedby = {0},
  pages = {369-380},
  booktitle = {Graphics Recognition. Ten Years Review and Future Perspectives, 6th Internation Workshop, GREC 2005, Hong Kong, China, August 25-26, 2005, Revised Selected Papers},
  editor = {Wenyin Liu and Josep Lladós},
  volume = {3926},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-540-34711-8},
}