Strip the Stripes: Artifact Detection and Removal for Scanning Electron Microscopy Imaging

Amirhossein Khalilian-Gourtani, Mariano Tepper, Victor Minden, Dmitri B. Chklovskii. Strip the Stripes: Artifact Detection and Removal for Scanning Electron Microscopy Imaging. In IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2019, Brighton, United Kingdom, May 12-17, 2019. pages 1060-1064, IEEE, 2019. [doi]

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