Umar Khan, Mark French, Harold Chong. Full beam Atomic Force Microscopy. In 2013 19th International Conference on Automation and Computing, London, United Kingdom, September 13-14, 2013. pages 1-6, IEEE, 2013. [doi]
@inproceedings{KhanFC13,
title = {Full beam Atomic Force Microscopy},
author = {Umar Khan and Mark French and Harold Chong},
year = {2013},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6662019},
researchr = {https://researchr.org/publication/KhanFC13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2013 19th International Conference on Automation and Computing, London, United Kingdom, September 13-14, 2013},
publisher = {IEEE},
}