Seyab Khan, Said Hamdioui. Temperature dependence of NBTI induced delay. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 15-20, IEEE, 2010. [doi]
@inproceedings{KhanH10-1,
title = {Temperature dependence of NBTI induced delay},
author = {Seyab Khan and Said Hamdioui},
year = {2010},
doi = {10.1109/IOLTS.2010.5560238},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2010.5560238},
researchr = {https://researchr.org/publication/KhanH10-1},
cites = {0},
citedby = {0},
pages = {15-20},
booktitle = {16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece},
publisher = {IEEE},
isbn = {978-1-4244-7724-1},
}