Mohammad Azam Khan, Yong-Hwa Kim, Jaegul Choo. Intelligent Fault Detection via Dilated Convolutional Neural Networks. In 2018 IEEE International Conference on Big Data and Smart Computing, BigComp 2018, Shanghai, China, January 15-17, 2018. pages 729-731, IEEE Computer Society, 2018. [doi]
@inproceedings{KhanKC18,
title = {Intelligent Fault Detection via Dilated Convolutional Neural Networks},
author = {Mohammad Azam Khan and Yong-Hwa Kim and Jaegul Choo},
year = {2018},
doi = {10.1109/BigComp.2018.00137},
url = {http://doi.ieeecomputersociety.org/10.1109/BigComp.2018.00137},
researchr = {https://researchr.org/publication/KhanKC18},
cites = {0},
citedby = {0},
pages = {729-731},
booktitle = {2018 IEEE International Conference on Big Data and Smart Computing, BigComp 2018, Shanghai, China, January 15-17, 2018},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-3649-7},
}