Applied AI in instrumentation and measurement: The deep learning revolution

Mounib Khanafer, Shervin Shirmohammadi. Applied AI in instrumentation and measurement: The deep learning revolution. IEEE Instrum. Meas. Mag., 23(6):10-17, 2020. [doi]

@article{KhanaferS20,
  title = {Applied AI in instrumentation and measurement: The deep learning revolution},
  author = {Mounib Khanafer and Shervin Shirmohammadi},
  year = {2020},
  url = {https://ieeexplore.ieee.org/document/9200875},
  researchr = {https://researchr.org/publication/KhanaferS20},
  cites = {0},
  citedby = {0},
  journal = {IEEE Instrum. Meas. Mag.},
  volume = {23},
  number = {6},
  pages = {10-17},
}