Experimental demonstration of stochastic comparators for fine resolution ADC without calibration - researchr publication authors

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Nguyen Ngoc Mai Khanh, Rimon Ikeno, Takahiro J. Yamaguchi, Tetsuya Iizuka, Kunihiro Asada. Experimental demonstration of stochastic comparators for fine resolution ADC without calibration. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 29-32, IEEE, 2016. [doi]

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