Scanner identification with extension to forgery detection

Nitin Khanna, George T.-C. Chiu, Jan P. Allebach, Edward J. Delp. Scanner identification with extension to forgery detection. In Edward J. Delp III, Ping Wah Wong, Jana Dittmann, Nasir D. Memon, editors, Security, Forensics, Steganography, and Watermarking of Multimedia Contents X, San Jose, CA, USA, January 27, 2008. Volume 6819 of SPIE Proceedings, SPIE, 2008. [doi]

@inproceedings{KhannaCAD08-0,
  title = {Scanner identification with extension to forgery detection},
  author = {Nitin Khanna and George T.-C. Chiu and Jan P. Allebach and Edward J. Delp},
  year = {2008},
  doi = {10.1117/12.772048},
  url = {http://dx.doi.org/10.1117/12.772048},
  researchr = {https://researchr.org/publication/KhannaCAD08-0},
  cites = {0},
  citedby = {0},
  booktitle = {Security, Forensics, Steganography, and Watermarking of Multimedia Contents X, San Jose, CA, USA, January 27, 2008},
  editor = {Edward J. Delp III and Ping Wah Wong and Jana Dittmann and Nasir D. Memon},
  volume = {6819},
  series = {SPIE Proceedings},
  publisher = {SPIE},
  isbn = {978-0-8194-6991-5},
}