Computing Two-Terminal Reliability in Mobile Ad Hoc Networks

S. Kharbash, Wenye Wang. Computing Two-Terminal Reliability in Mobile Ad Hoc Networks. In IEEE Wireless Communications and Networking Conference, WCNC 2007, Hong Kong, China, 11-15 March, 2007. pages 2831-2836, IEEE, 2007. [doi]

Authors

S. Kharbash

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Wenye Wang

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