Anant Kharkar, Roshanak Zilouchian Moghaddam, Matthew Jin, Xiaoyu Liu, Xin Shi, Colin B. Clement, Neel Sundaresan. Learning to Reduce False Positives in Analytic Bug Detectors. In 44th IEEE/ACM 44th International Conference on Software Engineering, ICSE 2022, Pittsburgh, PA, USA, May 25-27, 2022. pages 1307-1316, IEEE, 2022. [doi]
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