Sebastian Kiesel, Thomas Kern, Bernhard Wicht. Time-domain ramped gate sensing for embedded multi-level flash in automotive applications. In IEEE 60th International Midwest Symposium on Circuits and Systems, MWSCAS 2017, Boston, MA, USA, August 6-9, 2017. pages 691-694, IEEE, 2017. [doi]
@inproceedings{KieselKW17,
title = {Time-domain ramped gate sensing for embedded multi-level flash in automotive applications},
author = {Sebastian Kiesel and Thomas Kern and Bernhard Wicht},
year = {2017},
doi = {10.1109/MWSCAS.2017.8053017},
url = {https://doi.org/10.1109/MWSCAS.2017.8053017},
researchr = {https://researchr.org/publication/KieselKW17},
cites = {0},
citedby = {0},
pages = {691-694},
booktitle = {IEEE 60th International Midwest Symposium on Circuits and Systems, MWSCAS 2017, Boston, MA, USA, August 6-9, 2017},
publisher = {IEEE},
isbn = {978-1-5090-6389-5},
}