Toshihide Kikkawa, Tsutomu Hosoda, Ken Shono, Kenji Imanishi, Yoshimori Asai, Yifeng Wu, Likun Shen, Kurt Smith, Dixie Dunn, Saurabh Chowdhury, Peter Smith, John Gritters, Lee McCarthy, Ronald Barr, Rakesh Lal, Umesh Mishra, Primit Parikh. Commercialization and reliability of 600 V GaN power switches. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 6, IEEE, 2015. [doi]
@inproceedings{KikkawaHSIAWSSD15,
title = {Commercialization and reliability of 600 V GaN power switches},
author = {Toshihide Kikkawa and Tsutomu Hosoda and Ken Shono and Kenji Imanishi and Yoshimori Asai and Yifeng Wu and Likun Shen and Kurt Smith and Dixie Dunn and Saurabh Chowdhury and Peter Smith and John Gritters and Lee McCarthy and Ronald Barr and Rakesh Lal and Umesh Mishra and Primit Parikh},
year = {2015},
doi = {10.1109/IRPS.2015.7112766},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112766},
researchr = {https://researchr.org/publication/KikkawaHSIAWSSD15},
cites = {0},
citedby = {0},
pages = {6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}