Tae-Hyoung Kim, Wei Zhang 0032, Chris H. Kim. MIN Degradation. IEEE Trans. on Circuits and Systems, 59-I(3):584-593, 2012. [doi]
@article{Kim0K12,
title = {MIN Degradation},
author = {Tae-Hyoung Kim and Wei Zhang 0032 and Chris H. Kim},
year = {2012},
doi = {10.1109/TCSI.2011.2167264},
url = {http://dx.doi.org/10.1109/TCSI.2011.2167264},
researchr = {https://researchr.org/publication/Kim0K12},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {59-I},
number = {3},
pages = {584-593},
}