Gyung-bum Kim. Micro defect detection in solar cell wafer based on hybrid illumination and near-infrared optics. In 9th Asian Control Conference, ASCC 2013, Istanbul, Turkey, June 23-26, 2013. pages 1-5, IEEE, 2013. [doi]
@inproceedings{Kim13-77,
title = {Micro defect detection in solar cell wafer based on hybrid illumination and near-infrared optics},
author = {Gyung-bum Kim},
year = {2013},
doi = {10.1109/ASCC.2013.6606013},
url = {https://doi.org/10.1109/ASCC.2013.6606013},
researchr = {https://researchr.org/publication/Kim13-77},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {9th Asian Control Conference, ASCC 2013, Istanbul, Turkey, June 23-26, 2013},
publisher = {IEEE},
isbn = {978-1-4673-5767-8},
}