Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits

Byoungho Kim, Jacob A. Abraham. Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. IEEE Trans. on Circuits and Systems, 58-I(8):1773-1784, 2011. [doi]

Authors

Byoungho Kim

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Jacob A. Abraham

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