Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling

Dae-Woo Kim, Camilo Aguilar, Huixi Zhao, Mary L. Comer. Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling. IEEE Transactions on Image Processing, 28(10):5064-5076, 2019. [doi]

Authors

Dae-Woo Kim

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Camilo Aguilar

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Huixi Zhao

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Mary L. Comer

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